Decay characteristic measuring apparatus
US5548124A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 25, 1995 |
| Grant date | Aug 20, 1996 |
| Priority date | — |
| Expiry date | Aug 25, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/6408
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An excitation light beam intensity-modulated and output from a light-sending unit is irradiated on a target measurement object. A scattered light beam or a reaction light beam is detected by a light-receiving unit through a wavelength selector. The light-receiving unit outputs a signal according to the product of a supplied modulation signal and the received light beam. A processing unit acquires data corresponding to the product value for each type of light, and calculates the decay characteristics of the reaction light beam on the basis of the acquisition result. In this manner, with a simple arrangement, the decay time of a fluorescence sample or the like is precisely measured in a wide frequency range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.