Probe adapter for electronic device
US5548223A · kind A · utility
34Cited by
7References
3Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 16, 1995 |
| Grant date | Aug 20, 1996 |
| Priority date | — |
| Expiry date | Feb 16, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/0416
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An adapter for a measurement test instrument electrical probe has a flexible dielectric substrate with electrically conductive runs thereon. One end of the conductive runs has first electrical contacts with a pitch geometry corresponding to the pitch geometry of electrical contacts of an electronic device that is electrically connected to a substrate via the electrical contacts of the device. The other end of the conductive runs has second electrical contacts that have a pitch geometry compatible with the electrical probe of the measurement test instrument.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.