Patent · US Expired

Method and apparatus for providing high-speed column redundancy

US5548553A · kind A · utility

43Cited by
2References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 12, 1994
Grant dateAug 20, 1996
Priority date
Expiry dateDec 12, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/848
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A semiconductor memory device according to the invention includes a main memory array comprising a plurality of memory sub-arrays. Each of the memory sub-arrays comprises a plurality of columns and at least one redundant column. Each column of the memory sub-array also includes multiplexing means, coupled to the input and output path of the respective column and an input and output path of a neighboring column. In addition, the redundant column is coupled to the input and output path of a neighboring column. In the event that one of the columns of the memory sub-array is defective, the multiplexing means of each of the columns between the defective column and the redundant column acts to couple the input and output paths of that column to the input and output paths of the neighboring column. With such an arrangement, the defective column is bypassed and a memory device capable of operating without defects is provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.