Patent · US Expired

Methods for production of an optical assay device

US5550063A · kind A · utility

58Cited by
45References
14Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 10, 1993
Grant dateAug 27, 1996
Priority date
Expiry dateJun 10, 2013

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S436/805
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Method for producing an optical assay device having a substrate and one or more optical layers, an attachment layer and a receptive layer, including the step of spin coating an anti-reflective layer or an attachment layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.