Patent · US Expired

Method of using latchup current to blow a fuse in an integrated circuit

US5552338A · kind A · utility

26Cited by
9References
1Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 28, 1995
Grant dateSep 3, 1996
Priority date
Expiry dateSep 28, 2015

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/055

Abstract

A method for blowing a fuse in an IC device using the current generated by latchup. A fuse comprising a conductive material is caused to electrically open by directing a latchup current through the conductive material. The latchup current is generated by properly biasing parasitic bipolar transistors formed within the semiconductor substrate of the IC device, causing these parasitic transistors to latch up.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.