Patent · US Expired

Presence/absence bar code

US5552591A · kind A · utility

16Cited by
2References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 22, 1993
Grant dateSep 3, 1996
Priority date
Expiry dateFeb 22, 2013

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06K2019/06253
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A single width bar code exhibiting inherent self clocking characteristics is provided so as to be particularly useful in the identification of semiconductor wafers in very large scale integrated circuit manufacturing processes. The codes described herein are robust, reliable and highly readable even in the face of relatively high variations in scanning speed. The codes are also desirably dense in terms of character representations per linear centimeter, an important consideration in semiconductor manufacturing wherein space on the chips and the wafer is at a premium. Additionally, a preferred embodiment of the present invention exhibits a minimum number for the maximum number of spaces between adjacent bars in code symbol sequences.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.