System for dimensioning objects
US5555090A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Oct 24, 1994 |
| Grant date | Sep 10, 1996 |
| Priority date | — |
| Expiry date | Oct 24, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/0608
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention teaches a system for measuring the height of an object having an outer surface. The system comprises a system for generating an energy beam along a path, such as light, having a structured pattern, wherein the structured pattern of the energy beam irradiates the outer surface of the object. The structured light pattern comprises a constant dimension. The system further comprises a sensor for sensing the outer surface of the object irradiated by the structured pattern. Moreover, the system comprises a system for calculating the height of the object in response to the constant dimension of the structured pattern irradiating the outer surface of the object and sensed by the sensor. This system for calculating the height of the object preferably comprises a programmed computer containing a series of algorithmic steps for deriving a refined overall height profile of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.