Apparatus and methods for measurement system calibration
US5557267A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 23, 1993 |
| Grant date | Sep 17, 1996 |
| Priority date | — |
| Expiry date | Apr 23, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D18/008
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and methods for calibrating a transducer measurement system having a plurality of subsystems, permitting total system calibration by a few selected adjustments without requiring complete system calibration when a new subsystem is added or a subsystem replaced and without requiring adjustments to be made to each individual subsystem. The measurement system provides a calibrated measurement signal indicative of a characteristic of an object with which the transducer interfaces. Each subsystem is characterized in terms of a minimum number of parameters associated therewith and the parameters are mathematically combined to reflect values of adjustable subsystem or system components. In this manner, variations associated with each separable subsystem from nominal, specified values, are combined and corrected by a single adjustment of a minimum number of selected adjustable components representing the degrees of freedom for errors in the system. In an alternate embodiment, a signal processor is responsive to the subsystem describing parameters for processing a digital replica of a measured signal to provide the calibrated measurement signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.