Optical waveguide preform measurement during manufacture
US5558692A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 25, 1994 |
| Grant date | Sep 24, 1996 |
| Priority date | — |
| Expiry date | Jul 25, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method for measuring preform diameter and runout during manufacture of the preform. A Keyence LB1201 displacement gauge is used to determine distance between a sensing unit and the surface of an optical waveguide preform. It was found that the gauge produced an alternating signal imposed on a constant signal. By dividing the signal into its constant and alternating components, preform diameter and runout can be measured. A water cooled band pass filter and housing are used to protect the sensing unit. The preform surface can be mapped using a pair of sensing units, capable of moving parallel to the preform axis of rotation, located in diametric opposition about the preform.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.