Adapter for testing integrated circuits
US5559445A · kind A · utility
17Cited by
5References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 3, 1994 |
| Grant date | Sep 24, 1996 |
| Priority date | — |
| Expiry date | Nov 3, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/073
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A IC test adapter (100) for adapting the pin configuration of a chip carrier for use with test equipment. The IC test adapter (100) includes a case (101), printed circuit board (131), electrical contact pad(141), pin grid array (151) and bracket (161).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.