Three-dimensional measurement device and system
US5561526A · kind A · utility
172Cited by
4References
4Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 8, 1994 |
| Grant date | Oct 1, 1996 |
| Priority date | — |
| Expiry date | Nov 8, 2014 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N2013/0081
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A measurement device or system (11) for determining features of a three-dimensional object (20) from two-dimensional images includes a projector (27) for projecting a pattern (73) upon the object (20), at least one imager (17, 19) for obtaining multiple sets of image data of the illuminated object (20) and a processor (47) for obtaining a three-dimensional image (81) of the object (20) from the multiple sets of data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.