Patent · US Expired

Test method as well as a converter, a test set, and a test-program module therefor

US5577198A · kind A · utility

18Cited by

10References

14Claims

0Family size

Assignee

Alcatel SEL A.G. · DE

Inventors

Ursel Willrett · Gerlingen, DE
Konrad Schaupp · Gäufelden, DE

Key dates

Filing date	Jul 26, 1995
Grant date	Nov 19, 1996
Priority date	—
Expiry date	Jul 26, 2015

Classification

Technology area (CPC H)Electricity
CPC primaryH04L9/40
WIPO fieldDigital communication
WIPO sectorElectrical engineering

Abstract

To test a first device, the latter is connected to a simulator which simulates at least one second device according to a test case stored in a second data set. The simulator sends messages to the first device according to the test case, receives reply messages from the first device, and stores these reply messages in the second data set. According to the invention, the test is stored in advance as an abstract test scenario in a first data set. To generate the test case, the first data set is then mapped to the second data set by means of message-structure data and by insertion of basic-setting data. For evaluation, the second data set is mapped back to the first data set by data reduction.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.