Manufacturing defect analyzer with improved fault coverage
US5578930A · kind A · utility
23Cited by
12References
21Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 16, 1995 |
| Grant date | Nov 26, 1996 |
| Priority date | — |
| Expiry date | Mar 16, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/70
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A manufacturing defect analyzer for printed circuit boards which can detect open circuit faults between leads of components and the printed circuit board. The manufacturing defect analyzer can operate in an inductive coupling mode or a capacitive coupling mode. The same sensors are used in each mode, allowing different leads on the same part to be tested using either technique. A method is also disclosed whereby the device is used to rapidly and accurately detect manufacturing defects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.