Method and apparatus for automatically testing semiconductor diodes
US5578936A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 23, 1995 |
| Grant date | Nov 26, 1996 |
| Priority date | — |
| Expiry date | Jan 23, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2632
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A portable electronic test instrument is adapted for the automatic testing of semiconductor diodes regardless of the orientation of the diode relative to the test probes. The test instrument supplies an a.c. sine wave test voltage coupled to the test probes. The maximum negative voltage and the maximum positive voltage are measured and compared against a set of predetermined open and short circuit values to obtain a decision of open, short, or ok for each value. The combination of the two comparisons is used to determine the device status according to a decision criteria. The diode status is accordingly displayed on the graphical display of the test instrument, indicating the device is open, shorted, a diode with a forward orientation or a reverse orientation with respect to the test probes, or of an unknown type. The diode forward bias junction voltage is displayed regardless of its orientation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.