Patent · US Expired

Method for burn-in of high power semiconductor devices

US5579826A · kind A · utility

31Cited by
24References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 2, 1995
Grant dateDec 3, 1996
Priority date
Expiry dateMay 2, 2015

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S165/908
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A thermal control system for use with a burn-in system, the thermal control system capable of delivering a thermally preconditioned liquid to a plurality of semiconductor devices during burn-in. The thermal control system comprises a liquid reservoir containing a liquid, a pump, and a plurality of spray nozzle arrays. The liquid contained in the liquid reservoir is thermally preconditioned through the use of a heating element and a cooling element and the temperature of the liquid provided to each spray nozzle array is individually controlled through the use of a pipe heating element. The liquid is collected and returned to the liquid reservoir after being sprayed on the semiconductor devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.