Patent · US Expired

Method and apparatus for testing RF devices

US5581190A · kind A · utility

29Cited by
5References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 29, 1995
Grant dateDec 3, 1996
Priority date
Expiry dateApr 29, 2015

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R27/28
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An RF device (12), such as an amplifier, is tested by applying a digitally-modulated RF stimulus signal, having a known magnitude and phase angle, to the device to cause it to generate a response signal. The response signal of the device is down-converted and digitized prior to establishing its magnitude and phase angle. The magnitude and phase angle of the digitized, down-converted response signal are compared to the magnitude and phase angle, respectively, of the digitally-modulated stimulus signal to yield transfer functions indicative of the operation of the device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.