Patent · US Expired

Semiconductor foil beam-splitter for an infrared spectrometer

US5587831A · kind A · utility

5Cited by

3References

6Claims

0Family size

Assignee

Bruker Analytische Messtechnik GmbH · DE

Inventors

Arno Simon · Ettlingen, DE
Jurgen Gast · Rheinstetten, DE

Key dates

Filing date	Nov 23, 1993
Grant date	Dec 24, 1996
Priority date	—
Expiry date	Nov 23, 2013

Classification

Technology area (CPC G)Physics
CPC primaryG02B27/142
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In a self-supporting beam-splitter (1), in particular for use in an FTIR-spectrometer for the far-infrared region, with an optical thickness on the order of the interesting wavelength region, the foil beam-splitter (1) consists of an undoped semi-conducter material or carbon which is transparent in the far-infrared, and is preferentially made from thin silicon sheets or diamond foil in the thickness region between 2 .mu.m and 125 .mu.m. In this fashion, an extremely high efficiency for the beam-splitter is achieved, whereby little or no resonant absorption takes place due to the beam-splitter in the interesting wavelength region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.