Patent · US Expired

Nanocrystalline layer thin film capacitors

US5587870A · kind A · utility

80Cited by
8References
43Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 22, 1994
Grant dateDec 24, 1996
Priority date
Expiry dateJun 22, 2014

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/435
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

The invention relates to a method for forming a high capacitance thin film capacitor comprising forming layers of dielectric material in amorphous, nanocrystalline and polycrystalline configuration and arranging the resulting layers between upper and lower electrodes. The invention further comprises dielectric articles such as capacitors formed in accordance with the method of the invention and includes their use in an electronic circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.