Apparatus and method for monitoring casting process
US5589690A · kind A · utility
10Cited by
11References
25Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 21, 1995 |
| Grant date | Dec 31, 1996 |
| Priority date | — |
| Expiry date | Mar 21, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/207
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention uses a high energy x-ray, neutron, or gamma source for monitoring the interface between a molten and solidified crystalline phase while in a furnace in a casting process. The radiation can also be used to determine the quality and orientation of the crystals in the crystalline phase. The invention uses the distinctive diffraction patterns produced by crystalline and amorphous phases to locate the interface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.