Method and apparatus for imaging obscured areas of a test object
US5594770A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 18, 1994 |
| Grant date | Jan 14, 1997 |
| Priority date | — |
| Expiry date | Nov 18, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/043
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus are provided for imaging obscured areas of a test object. The apparatus includes an x-ray source having a cathode for producing a steerable electron beam. A controller directs the electron beam to predetermined locations on a target anode. The user may flexibly select appropriate predetermined positions. The predetermined locations may be obtained from the geometry of an obscuration. A detector receives x-rays that are transmitted through the test object from each of the predetermined locations, and produces images corresponding to each of the predetermined locations. The images are digitized and may be combined to produce an unobscured image of a region of interest.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.