Continuous motion electrical circuit interconnect test method and apparatus
US5596283A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 19, 1995 |
| Grant date | Jan 21, 1997 |
| Priority date | — |
| Expiry date | Dec 19, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2808
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Electrical test method and apparatus for performing the method. The method operates to determine an electrical characteristic of a node (2) disposed upon a surface of a substrate (3), such as a printed wiring board (PWB). The method includes a first step of providing relative motion between a probe (1) and the surface of the PWB. A second step measures the electrical characteristic during a time that there is relative motion between the probe and the surface of the PWB. In one embodiment of the invention the step of measuring measures capacitance while in another embodiment of the invention the step of measuring measures charge capacity. The step of providing relative motion, in one embodiment of the invention, includes the steps of maintaining the PWB stationary while linearly translating the probe over the surface. In another embodiment of the invention the step of providing relative motion includes the steps of maintaining the probe stationary while moving the PWB.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.