Patent · US Expired

Single clock scan latch

US5596584A · kind A · utility

15Cited by
4References
6Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 24, 1995
Grant dateJan 21, 1997
Priority date
Expiry dateAug 24, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K3/0375
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A half-latch for a scan latch is described. The half-latch has an input terminal for receiving an input signal a first control terminal for receiving a clock signal and an output terminal. When enabled, the half-latch adopts a data transfer state in which it transmits a signal from its input terminal to its output terminal. Alternatively, the half-latch can adopt a data holding state in which a signal is stored on the output terminal, these states being selected in dependence on the state of the clock signal. The half-latch described herein has a second control terminal which receives the control signal to selectively disable the half-latch. This allows a common clock signal to be used when a scan latch is constructed using these half-latches.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.