Patent · US Expired

Semiconductor integrated circuit device and a manufacturing method thereof

US5604365A · kind A · utility

43Cited by
2References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 29, 1994
Grant dateFeb 18, 1997
Priority date
Expiry dateAug 29, 2014

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/30

Abstract

A semiconductor integrated circuit device having a DRAM consisting of memory cells, comprises; a first conductive film deposited over the main surface of a semiconductor substrate and used to form a gate electrode of a memory cell selection MISFET; a second conductive film deposited over the first conductive film and used to form bit lines to transfer data of a memory cell to a sense amplifier; a third conductive film deposited over the second conductive film and used to form a storage node of a capacitor; a fourth conductive film deposited over the third conductive film and used to form a plate electrode of the capacitor; and a fifth conductive film deposited over the fourth conductive film and used to form an interconnect, wherein a transistor in a direct peripheral circuit arranged close to a memory array is electrically connected, through a pad layer formed of the third conductive film, to the interconnection of the fifth conductive film deposited over the fourth conductive film, thereby allowing the aspect ratio of the contact hole formed over the pad layer to be reduced.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.