Patent · US Expired

Method for forming a pattern of non-volatile ferroelectric thin film memory

US5605723A · kind A · utility

11Cited by
13References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 2, 1995
Grant dateFeb 25, 1997
Priority date
Expiry dateMay 2, 2015

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S430/168
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A pattern of a non-volatile high-performance ferroelectric thin film memory is formed by applying a composition containing hydrolytic metal compounds, and a photosensitizer which generates water when irradiated with active rays onto a substrate. The resultant film is exposed to active rays in compliance with a prescribed pattern to form an image and developed with a solvent to remove non-exposed portions, and then the remaining exposed portions are subjected to a heat treatment to convert the exposed portions into a dielectric substance comprising a metal oxide as expressed by the following formula (I): EQU (Bi.sub.2 O.sub.2).sup.2+ (A.sub.m-1 B.sub.m O.sub.3m+1).sup.2-(I) where A is one or more elements selected from the group consisting of Ba, Sr, Pb and Bi; B is one or more elements selected from the group consisting of Ti, Nb and Ta; and m is an integer of from 2 to 5.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.