Patent · US Expired

System and method for inspection of products with warranties

US5608658A · kind A · utility

5Cited by
2References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 10, 1995
Grant dateMar 4, 1997
Priority date
Expiry dateAug 10, 2015

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/2273
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A batch of units of a product are inspected before they are supplied to customers with warranties. The units are either defective or non-defective, realizing a defect index which is a random variable characterized by a statistical distribution. During the inspection, the units identified as being defective are repaired. A dynamic inspection technique has been developed and can be used to identify different thresholds for which number of units within a batch need to be inspected, such that costs due to the inspection, repair and warranty are minimized.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.