Contour measurement system
US5612786A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 8, 1995 |
| Grant date | Mar 18, 1997 |
| Priority date | — |
| Expiry date | Dec 8, 2015 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N2013/0081
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for measuring the contours (30) of a three-dimensional object (4); and a method for calibrating an optical system (2, 8). The object (4) is placed into the field of view of the optical system (2, 8). The optical system (2, 8) is activated to obtain a set of data giving a phase (x.sub.t) at each of a plurality of pixels corresponding to the object (4). The phases (x.sub.t) are unwrapped, e.g., by a method of ordered phase unwrapping. The unwrapped phases are converted into a set of three-dimensional coordinates (x.sub.s, y.sub.s, z.sub.s) of the object (4) for each of the pixels. These coordinates (x.sub.s, y.sub.s, z.sub.s) can be portrayed on a display of a computer (10). The method for calibrating the optical system (2, 8) shares several common steps with the above method. In addition, coordinates of a test calibration fixture (38, 46) are first mechanically measured. Following optical measurement of the calibration fixture (38, 46), an optimization procedure is used to minimize the difference between the mechanically measured coordinates (x.sub.m, y.sub.m, z.sub.m) and the coordinates (x.sub.s, y.sub.s, z.sub.s) calculated from the optical measurements. The optimization…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.