Patent · US Expired

Method of and apparatus for correcting scattered X-rays for X-ray computerized tomograph

US5615279A · kind A · utility

64Cited by
5References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 1, 1994
Grant dateMar 25, 1997
Priority date
Expiry dateNov 1, 2014

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2235/086
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

In a scattered X-ray correction method for an X-ray computerized tomograph, the quantity of X-rays passed through a phantom is measured to be converted into logarithms. Obtained from the logarithmic data is a scattered X-ray correction curve representing a relationship between the measured data in the logarithmic expression and an amount of scattered X-ray correction. For a subject, the quantity of X-rays penetrated therethrough is measured to be transformed into logarithms. From the measured data undergone the logarithmic conversion and the scattered X-ray correction curve, there is attained a scattered X-ray correction amount in a linear region which is the state before the logarithmic conversion. The measured data of the subject in the logarithmic expression is subjected to an inverse logarithmic conversion. From the obtained values, the scattered X-ray correction amount is subtracted such that the resultant values are again converted into logarithms, thereby producing a computerized tomogram from the logarithmic values.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.