Patent · US Expired

Storage system self-test apparatus and method

US5615335A · kind A · utility

67Cited by
5References
35Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 10, 1994
Grant dateMar 25, 1997
Priority date
Expiry dateNov 10, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/36
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A self-testing storage system apparatus and method uses pre-recorded test sequences at a designated location within a storage system, so that a user interface task, residing in the controller of the storage system responds to a signal to initiate testing sent through a user interface device coupled to the controller. The user interface task causes the test sequences to be transferred into the controller. The user interface task also disables communications through the host interface, determines from parameters sent over the user interface which tests are to be run, and causes them to be executed as manufacturing self-test tasks from within the controller, using the controller's microprocessor and memory. Depending upon the parameters provided through the user interface device, each manufacturing self-test task executes sequential and random read/write/compare tests, data or command saturation tests, RAID evaluation tests, or other tests within the storage system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.