Pulse method for measurement of relative secondary path intensities in optical waveguide systems
US5617200A · kind A · utility
2Cited by
0References
13Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 27, 1995 |
| Grant date | Apr 1, 1997 |
| Priority date | — |
| Expiry date | Dec 27, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/95
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for measuring the secondary path intensity of an optical unit, such as an optical amplifier, is provided. The method includes applying a pulse of light to a first end of the unit and detecting the light exiting from the second end of the unit. The exiting light is analyzed to determine a primary pulse intensity and a secondary pulse intensity which preferably includes the effects of Rayleigh backscattering (RBS). The ratio of the secondary pulse intensity to the primary pulse intensity provides an accurate measure of the unit's secondary path intensity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.