Patent · US Expired

Method for adaptive learning type general purpose image measurement and recognition

US5619589A · kind A · utility

9Cited by
10References
1Claims
0Family size

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Key dates

Filing dateDec 5, 1994
Grant dateApr 8, 1997
Priority date
Expiry dateDec 5, 2014

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V10/70
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An adaptive learning type general purpose image measurement and recognition method includes the steps of extracting a large number of basic initial features having values which are invariant to parallel displacement of an object to be caught in an image frame and which have additivity with respect to the image frame and performing statistical feature extraction having a learning function on the basis of a multivariate analysis method applied to the extracted initial features to thereby adaptively enable use for various types of measurement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.