Membrane probing of circuits
US5623213A · kind A · utility
103Cited by
33References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 6, 1996 |
| Grant date | Apr 22, 1997 |
| Priority date | — |
| Expiry date | May 6, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/0735
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
First and second bumps electrically connected at first and second positions along a conductive run borne by a flexible substrate are respectively oriented for contact with a pad of a die under test and a pad of a tester structure. Second and third conductive regions are electrically connected respectively to the power and ground terminals of a power source and an electrical device. The second and third regions are spaced from a first conductive region to filter high-frequency noise components from power and ground potentials provided by the power source,
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.