Mass spectrometer, especially ICP-MS
US5625185A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Sep 22, 1995 |
| Grant date | Apr 29, 1997 |
| Priority date | — |
| Expiry date | Sep 22, 2015 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/026
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
In mass spectrometers with a plasma ion source (ICP-MS), a high ion current takes effect on the entrance of the ion optical system. The components provided there, especially lenses and apertures, have hitherto been made of steel. Atoms and ions are released from the surface of the components by a sputtering effect. This results in a correspondingly spoiling background signal and in losses in the quality of the analysis. To avoid the described effects, the components which are subjected to ion bombardment are made of graphite. The sputter rate and the ion yield of the carbon are much lower than those of steel (iron, nickel and chromium).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.