Surface acoustic wave filter with an optimizing reflector thickness-to-wavelength ratio
US5625329A · kind A · utility
3Cited by
4References
6Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Apr 17, 1996 |
| Grant date | Apr 29, 1997 |
| Priority date | — |
| Expiry date | Apr 17, 2016 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03H9/02574
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A SAW device formed by providing at least one interdigital transducer on a piezoelectric substrate which is prepared by forming a (1120) ZnO piezoelectric thin film on a (0112) plane .alpha.-Al.sub.2 O.sub.3 substrate, and forming reflectors on both sides of the interdigital transducer along a surface wave propagation direction. Each of the reflectors is so structured that a ratio H/.lambda. of its thickness H to a wavelength .lambda. of a surface wave is in a range of 0.015 to 0.041.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.