Method and apparatus for non-contact measurement of relative displacement
US5625457A · kind A · utility
2Cited by
4References
2Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 31, 1995 |
| Grant date | Apr 29, 1997 |
| Priority date | — |
| Expiry date | Oct 31, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for performing non-contact measurement of relative displacement includes a microscope having one objective lens and two fields of view in which two points of measurement on a test piece can be located separately, a pair of cameras for taking images obtained with the microscope, and an apparatus for measuring the relative displacement of the images of the two points of measurement obtained by the cameras.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.