Patent · US Expired

In-situ sizing of photolithographic mask or the like, and frame therefore

US5626784A · kind A · utility

5Cited by
9References
4Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 31, 1995
Grant dateMay 6, 1997
Priority date
Expiry dateMar 31, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K3/0082
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

Alignment of a mask, such as a photolithographic mask, to a workpiece, such as a printed circuit board is improved using a frame having sides that are individually thermally expandable. The mask is fabricated to be undersized so that the distance between fiducials on the mask is less than a desired distance, which may be the distance between corresponding fiducials on the workpiece. The mask is mounted on the frame, whereafter at least one side of the frame is heated to expand the side and stretch the mask to achieve the desired interfiducial distance.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.