Method for locating flaws in a smooth surface of an object
US5627646A · kind A · utility
8Cited by
14References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 21, 1995 |
| Grant date | May 6, 1997 |
| Priority date | — |
| Expiry date | Jul 21, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/306
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for locating flaws in a smooth surface using at least one light source includes the steps of setting the light source at a predetermined length above the smooth surface, locating a highlight line, translating the light source across the smooth surface to create a plurality of highlight lines and locating distortions in the smooth surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.