Multiplexing electronic test probe
US5629617A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 6, 1995 |
| Grant date | May 13, 1997 |
| Priority date | — |
| Expiry date | Jan 6, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2886
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An analog electronic test probe includes hundreds of inputs each connected to two amplifiers, each in a separate multiplexer stage on an integrated circuit. A programmer, responsive to a dial, shifts data through a shift register of latches each of which is connected to one of the amplifiers, activating the amplifier(s) connected to the selected input, thereby multiplexing it (them) to selected output(s). Similarly, the gain for each output may be selected. An outdisable circuit connected to the outputs of each multiplexer and the outputs of each IC chip causes each output to appear electrically as an open circuit when no input associated with the multiplexer or chip is selected. This permits any number of multiplexers and IC chips to be daisy-chained together.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.