Global MTF measurement system
US5629766A · kind A · utility
13Cited by
2References
21Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Sep 6, 1995 |
| Grant date | May 13, 1997 |
| Priority date | — |
| Expiry date | Sep 6, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/0292
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The MTF for an optical or electronic device(s) is evaluated over a substantial portion of an image signal. As a result, a composite MTF representing a more global evaluation is achieved. Furthermore, the MTF for all or part of a system can be evaluated in situ.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.