Method and apparatus for interim in-situ testing of an electronic system with an inchoate ASIC
US5629876A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 31, 1992 |
| Grant date | May 13, 1997 |
| Priority date | — |
| Expiry date | Aug 31, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/33
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A technique is described for testing the performance of a target electronic system ultimately employing an ASIC comprising a core cell and surrounding logic, using an inchoate (designed, but not yet fabricated) ASIC on an interim basis. In one embodiment, a Q-part, or qualification part, which is essentially a bond-out of the core cell, is used in conjunction with programmable logic devices configured to perform the function of the surrounding logic. The Q-part and programmable logic are interconnected on a pod, and plugged into an interim version of a target electronic system. In another embodiment, the Q-part is software-simulated and interconnected on the pod to programmable logic devices. The programmable logic devices may be programmed either on-pod or off-pod, and signals incident to the operation of the pod plugged into the interim electronic system can be monitored and controlled.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.