Apparatus and method for non-destructive testing of structures
US5633467A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Dec 1, 1995 |
| Grant date | May 27, 1997 |
| Priority date | — |
| Expiry date | Dec 1, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/161
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for non-destructive testing of the load bearing characteristics of a structure are disclosed. An interferometer is supported by a beam which is supported away from the surface of the structure to be tested. The interferometer is used to measure a quantity which varies with the distance between the interferometer and a reflecting means supported on the location to be tested. The reflecting means is supported in such a manner as to move responsively with deformations to the said location, and is typically attached to a probe which is urged against the said location. Preferably a force is applied or varied near the location to be tested and comparisons are made over time or as the said force varies. Such a system does not damage the structure, and does not require complicated equipment or processing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.