Patent · US Expired

Nonvolatile memory device

US5633821A · kind A · utility

30Cited by
4References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 18, 1995
Grant dateMay 27, 1997
Priority date
Expiry dateJan 18, 2015

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/223
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A nonvolatile memory with a simple structure where recorded information can be read without destruction. A voltage is impressed between a control gate and a memory gate for writing. A ferroelectric layer is polarized in accordance with the direction of the impressed voltage. A control gate voltage to make channel is small when the ferroelectric layer is polarized with the control gate side being positive. Control gate voltage to make channel is large when the ferroelectric layer is polarized with the control gate side being negative. The reference voltage is impressed on the control gate for reading. A large drain current flows when the ferroelectric layer is polarized with a second polarization and a small drain current flows when the ferroelectric layer is polarized with a first polarization. Record information can be read by detecting the drain current. Polarization status of the ferroelectric is not destroyed in the reading operation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.