X-ray computed tomography apparatus of the electron beam type with electron beam intensity measuring capacity

US5633906A · kind A · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Erich Hell · Erlangen, DE
• Manfred Fuchs · Nuremberg, DE

Key dates

• Filing date: Apr 10, 1996
• Grant date: May 27, 1997
• Expiry date: Apr 10, 2016

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2223/419
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

In an x-ray beam computed tomography apparatus having a ring anode scanned by an electron beam for producing an x-ray beam which rotates around an examination region, measurement of the intensity distribution in the electron beam is enabled at various locations of the ring anode during operation. For this purpose, the ring anode can have at a number of locations around its circumferential direction, insulated sub-anodes with an insulating interspace therebetween, to which a measuring arrangement for measuring the charge distribution, and thus the intensity distribution, in the electron beam is connected. The charge distribution is measured when the electron beam sweeps the interspace between two sub-anodes.