Device for supplying gas to an analyzer of traces of impurities in a gas
US5635620A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 20, 1995 |
| Grant date | Jun 3, 1997 |
| Priority date | — |
| Expiry date | Oct 20, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/0006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for supplying gas to an analyzer for measuring traces of impurities in the gas comprising: (i) a source of pure gas; (ii) a set of at least first and second bypass gas lines, arranged in parallel and fed by the source of pure gas, the first and second bypass gas lines having a common gas entry and a common gas exit, the common gas exit being in communication with a feed line of the analyzer through a common gas exit line; (iii) a device for charging a gas in the first bypass gas line with a predetermined quantity of at least one impurity for forming a standardizing gas; (iv) a restriction disposed in each of the first and second bypass gas lines, each restriction being calibrated to divide the flow of pure gas feeding the set between the first and second bypass lines in a predetermined ratio; and (v) a flow regulator for regulating the flow of pure gas feeding the set of bypass gas lines, disposed between the source of pure gas and the common gas entry of the first and second bypass gas lines, wherein the first and second bypass gas lines, between the common gas entry and the calibrated restriction are devoid of any pressure-measuring member.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.