System for optically measuring the surface contour of a part using more fringe techniques
US5636025A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 17, 1994 |
| Grant date | Jun 3, 1997 |
| Priority date | — |
| Expiry date | Jun 17, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2527
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical measuring system comprises an illumination arrangement including a light source, grating, and lens, and an image acquisition arrangement, including a lens, grating, and camera. A mechanical translation device moves the grating in a plane parallel to a reference surface to effect a phase shift of a projected image of the grating on the contoured surface to be measured. A second mechanical translation device moves the lens to effect a change in the contour interval. A first phase of the points on the contoured surface is taken, via a four-bucket algorithm, at a first contour interval. A second phase of the points is taken at a second contour interval. A controller, including a computer, determines a coarse measurement using the difference between the first and second phases. The controller further determines a fine measurement using either the first or second phase. The displacement or distance, relative to the reference plane, of each point is determined, via the controller, using the fine and coarse measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.