Diffuse reflectance monitoring apparatus
US5636633A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 9, 1995 |
| Grant date | Jun 10, 1997 |
| Priority date | — |
| Expiry date | Aug 9, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/49
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An improved apparatus for diffuse reflectance spectroscopy having a specular control device. The specular control device has at least a first surface divided into an even-numbered plurality of reflecting sections and open or transmitting sections. The number of reflecting sections is equal to the number of open sections. Each reflecting section is situated between a pair of open sections and opposite to another reflecting section. Similarly, each open section is situated between a pair of reflecting sections and is opposite to another open section. In one preferred embodiment, the total surface area of the reflecting sections is equal to the total surface area of the open sections. In another embodiment, the total surface area of the reflecting sections is unequal to the total surface area of the open sections. In another preferred embodiment, opaque spacers are provided on the borders between adjacent sections to improve the detecting definition between source and reflected beams, and, to selectively provide for decreasing surface area of one or more selected sections.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.