Vacuum extraction sampling system
US5637809A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 2, 1995 |
| Grant date | Jun 10, 1997 |
| Priority date | — |
| Expiry date | Jun 2, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2001/244
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A gas sampling system utilizes small sample vacuum transport to reduce the dew point of the sample. A vacuum pump maintains a substantial vacuum on the sampling system causing a sample, drawn at a rate less than a liter per minute, to be drawn and transported under partial vacuum for analysis. A dryer can be placed near the sampling probe to further reduce the dew point prior to the vacuum transport. The dew point of the sample is affected by both the dryer and the degree of vacuum transporting the gas mixture. As such, the dew point can be varied indefinitely by any reasonable combination of moisture removal by the dryer and vacuum pump strength.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.