Method and system for inspecting die sets using free-form inspection techniques
US5638301A · kind A · utility
3Cited by
40References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 26, 1995 |
| Grant date | Jun 10, 1997 |
| Priority date | — |
| Expiry date | Sep 26, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The method and system provide a means of inspecting die sets by scanning the core die and the cavity die separately. A special software technique is used to transform both data scans to the same coordinate system or frame in an orientation which simulates die closure. Then methods are used to determined the exact shape of the interior of the die set when closed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.