Patent · US Expired

Photoresist composition with improved differential solubility through hydroxyl group blocking via reaction with vinyl ethers

US5641604A · kind A · utility

7Cited by
3References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 4, 1996
Grant dateJun 24, 1997
Priority date
Expiry dateJan 4, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/022
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A photoresist composition comprising an alkali soluble resin and an ortho-naphthoquinone diazide sulfonic acid ester of a polyhydroxy alcohol. The photoresist is characterized by having at least a portion of its free hydroxyl groups on the photoactive compound blocked with an acid labile blocking group that generates a hydroxide upon cleavage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.