Sidescatter X-ray detection system
US5642394A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Apr 3, 1996 |
| Grant date | Jun 24, 1997 |
| Priority date | — |
| Expiry date | Apr 3, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/207
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An edge enhancement X-ray imaging system inspects an object for detecting an illegal component. The system illuminates the object with penetrating radiation which is sidescattered from the object and captured by a pair of radiant detectors. The detectors are symmetrically positioned opposite each other, being adjacent the two sides of the object. Each detector has a detecting surface substantially parallel to the beam for converting sidescattered radiation into a pair of electrical signals which define a location of an edge of the illegal component. In response to the electrical signals, a video display produces a visual image of the edge. In another embodiment of the invention, the system further comprises a pair of backscatter detectors which convert the backscattered radiation into a second pair of electrical signals producing a second visual image on the video display. As a result of superimposing the second image onto the first image associated with the sidescatter detectors, the detection of components of the object is greatly improved.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.