Method of determining the spatial field distribution

US5644229A · kind A · utility

Assignee

• U.S. Philips Corporation · US

Inventors

• Olaf Dössel · Norderstedt, DE
• Hans-Aloys Wischmann · Henstedt-Ulzburg, DE
• Manfred Fuchs · Nuremberg, DE
• Rob Steenbrink · Roermond, NL
• Robert Oostenveld · Groningen, NL

Key dates

• Filing date: Nov 7, 1995
• Grant date: Jul 1, 1997
• Expiry date: Nov 7, 2015

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R33/0206
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The invention relates to a method of determining the spatial field distribution and/or the spatial position of a useful field source, producing said field distribution, by means of a multichannel field measuring device which comprises a plurality of spatially distributed sensors which produce measured values which contain on the one hand useful measured values stemming from the useful field source and on the other hand noise measured values stemming from at least one noise field source, correction values being formed and superposed on the measured values so that compensated measured values are obtained which are compared with similarly compensated, mathematically derived reference values which are produced by a fictitious reference field source by means of the field sensors, the reference field source being determined for which the pattern of compensated reference values corresponds best to the pattern of compensated measured values.